2007
Stanislav Markov
University of Glasgow
“Band-gap and permittivity change at high-k gate stack interfaces — device perspective”
with S. Roy, C. Fiegna, E. Sangiorgi, and A. Asenov |
2006
Laurent Thevenod
CEA-LETI/MINATEC
“Characterization of TiN/HfO2/SiO2 MOSFETs by extracting mobility from magnetoresistance measurements”
with M. Cassé, W. Desrat, M. Mouis, G. Reimbold, and F. Boulanger |
2005
Frank C. Yeh
Yale University
“SONOS-type Non-volatile Memory with All Silicon Nitride Dielectric Stack”
with Y. X. Liu, X. W. Wang, and T.P. Ma |
2004
Miaomiao Wang
Yale University
“Tunneling Spectroscopy Study of Traps in MOS Structures with
High-k Gate Dielectrics”
with W. He and T.P. Ma |
2003
Mike J. Hale
UCSD
“Oxygen and Oxide Bonding on GaAs(001)- c(2x8)/(2x4): An Atomic
Understanding of Fermi Level Pinning and Unpinning”
with J. Z. Sexton, S. I. Yi, D. L. Winn,
M. Passlack (Motorola), and A. C. Kummel |
2002
Wenjuan Zhu
Yale University
“Mobility extraction for MOSFET's made with ultra-thin high-k
dielectrics: correct accounting of channel carriers”
with T.P. Ma, T. Tamagawa and W.Y. Wang |
2001
Thomas Kauerauf
IMEC
“Low Weibull slope of breakdown distributions in high-k layers”
with Robin Degraeve, Charlotte Soens, Guido Groeseneken
(IMEC), Eduard Cartier (IBM/IMEC) |
2000
Z. J. Luo
Yale University
“Characterization of Ultra-thin (~1nm) Zr Silicate for CMOS
Gate Application”
with T.P. Ma, E. Cartier, M. Copel, T. Tamagawa and
B. Halpern |
1999
Shigayasu Uno
Osaka University
“I-V Characteristics of Ultra Thin Oxide Films after Soft Breakdown”
with T. Sakura, Y. Kamakura and K. Taniguchi |
1998
M. K. Das
Purdue University
“Inversion Channel Mobility in 4H- and 6H-SiC MOSFETs”
with J.A. Cooper, Jr., M.R. Melloch,
and M.A. Capano |
1997
Tanya Nigam
IMEC
“Is the Constant Current Charge-to- Breakdown Test Still a
Valid Tool to Study the Reliability of MOS Structures?”
with R. Degraeve, G. Groeseneken, M. Heyns |
1996
Jan De Blauwe
IMEC
“Degradation and Nitridation Dependence of Steady-State SILC”
with R. Degraeve, R. Bellens, J. Van Houdt, G. Groesenenken
and H.E. Maes |
1995
K. A. Ellis
Cornell University
“Gas Phase Chemistry of N2O Furnace Oxidation”
with R.A. Buhrman |
