IEEE SISC

The abstracts reproduced in the Book of Abstracts are for the use of SISC attendees only to encourage participants to submit new, unpublished and sometimes controversial work. Therefore, the conference policy is that the abstracts may not be referenced. However, the presentation itself, which may be significantly different than the accepted abstracts, may be cited e.g. "as discussed at the 2005 IEEE SISC, Washington, DC, USA."

Past SISC Technical Programs

	43^nd SISC 2012	42^nd SISC 2011	41^st SISC 2010
40^th SISC 2009	39^th SISC 2008	38^th SISC 2007	37^th SISC 2006
36^th SISC 2005	35^th SISC 2004	34^th SISC 2003	33^rd SISC 2002
32^nd SISC 2001	31^st SISC 2000	30^th SISC 1999	29^th SISC 1998
28^th SISC 1997	27^th SISC 1996	26^th SISC 1995	25^th SISC 1994
24^th SISC 1993	23^rd SISC 1992	22^nd SISC 1991	21^st SISC 1990
20^th SISC 1989	19^th SISC 1988	18^th SISC 1987	17^th SISC 1986
16^th SISC 1985	15^th SISC 1984	14^th SISC 1983	13^th SISC 1982
12^th SISC 1981	11^th SISC 1980	10^th SISC 1979	9^th SISC 1978
8^th SISC 1977	7^th SISC 1976	6^th SISC 1975	5^th SISC 1974
4^th SISC 1973	3^rd SISC 1968	2^nd SISC 1967	1^st SISC 1965

Contribution of documents by Dr. R. E. Stahlbush (NRL), Prof. T. P. Ma (Yale), Prof. D. M. Fleetwood (Vanderbilt), Prof. R. Bassett (NCSU, author of To the digital age: research labs, start-up companies, and the rise of MOS technology), and Dr. B. E. Deal (Fairchild Semiconductor) is gratefully acknowledged. If you happen to have the abstract book from any of the years we are still missing, please contact the webmaster.

Past Wednesday Evening Tutorials

The Wednesday evening Tutorials aim to give a good foundation in one topic frequently covered at the conference. The Tutorials are free for all SISC registered attendees.

2012: Dr. Dirk Wouters, imec, Leuven, Belgium
Resistive switching materials and devices for future memory applications
2011: Prof. Mark Lundstrom, Purdue University, West Lafayette, IN, USA
Understanding the nanoscale MOSFET
2010: Dr. Matthias Passlack, TSMC Europe, Leuven, Belgium
Interface state analysis on non-silicon semiconductors and the role of heterostructures
2009: Dr. Thomas Schroeder, IHP Frankfurt (Oder), Germany
Physical characterization of thin oxide films by XRD and XPS: From conventional laboratory to modern synchrotron techniques
2008: Prof. Guido Groeseneken, imec & KU Leuven, Belgium
Introduction to charge pumping and its applications

SISC History

Prof. T. P. Ma, Yale U., USA: Gate Dielectrics, Interfaces, and SISC (2009)
Prof. H. Z. Massoud, Duke U., USA: A brief history of the first 25 years of SISC (1994)
Invitation letter to Dr. B. E. Deal (1967)
Abstracts from the first SISC (1965)

Note: all above documents are searchable.